in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, ISSN: 1286-0042
Volume: 27, Número: 1-3, Páginas: 423-426 (4)
Conference
10Th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (Drip 10), Date: SEP 29-OCT 02, 2003, Location: Batz sur Mer, FRANCE