Optomechanical System for Photonic Chip Characterization

AuthID
P-00Y-EEY
4
Author(s)
Fernandes, M
·
Fidalgo, J
·
2
Editor(es)
Soskind,Y;Busse,LE
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in PHOTONIC INSTRUMENTATION ENGINEERING X in Proceedings of SPIE, ISSN: 0277-786X
Volume: 12428
Conference
Conference on Photonic Instrumentation Engineering X, Date: JAN 30-FEB 01, 2023, Location: San Francisco, CA
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-85159781535
Wos: WOS:001011088400013
Source Identifiers
ISSN: 0277-786X
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.