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An Exact Solution to the Minimum Size Test Pattern Problem
AuthID
P-000-T1X
3
Author(s)
Flores, PF
·
Neto, HC
·
Marques Silva, JP
Document Type
Article
Year published
2001
Published
in
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS,
ISSN: 1084-4309
Volume: 6, Issue: 4, Pages: 629-644 (16)
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Wos
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Scopus
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/en/publications/view/26685
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Metadata
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Publication Identifiers
DOI
:
10.1145/502175.502186
Dblp
: journals/todaes/FloresNM01
Scopus
: 2-s2.0-33746845358
Unpaywall
: 10.1145/502175.502186
Wos
: WOS:000173133200011
Source Identifiers
ISSN
: 1084-4309
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