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Test Pattern Generation for Width Compression in Bist
AuthID
P-001-5VA
4
Author(s)
Flores, P
·
Neto, H
·
Chakrabarty, K
·
Marques Silva, J
Document Type
Proceedings Paper
Year published
1999
Published
in
ISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1: VLSI,
ISSN: 0271-4310
Volume: 1, Pages: 114-118 (5)
Conference
1999 Ieee International Symposium on Circuits and Systems (Iscas 99),
Date:
MAY 30-JUN 02, 1999,
Location:
ORLANDO, FL,
Sponsors:
IEEE
Indexing
Wos
®
Scopus
®
Dblp
®
/en/publications/view/38762
Metadata
Sources
Publication Identifiers
DBLP
: conf/iscas/FloresNCS99
SCOPUS
: 2-s2.0-0032692708
Wos
: WOS:000081715100028
Source Identifiers
ISSN
: 0271-4310
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