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Physical Design Of Testable Cmos Digital Integrated-Circuits
AuthID
P-001-QM0
3
Author(s)
DESOUSA, JJHT
·
GONCALVES, FM
·
TEIXEIRA, JP
Document Type
Article
Year published
1991
Published
in
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
ISSN: 0018-9200
Volume: 26, Issue: 7, Pages: 1064-1072 (9)
Conference
European Solid-State Circuits Conference 1990 - Esscirc '90,
Date:
19 September 1990 through 21 September 1990,
Location:
Grenoble, Fr
Indexing
Wos
®
Scopus
®
Google Scholar
®
Metadata
Sources
Publication Identifiers
DOI
:
10.1109/4.92027
Scopus
: 2-s2.0-0026185562
Wos
: WOS:A1991FR50200021
Source Identifiers
ISSN
: 0018-9200
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