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Investigating the Use of Bics to Detect Resistive- Open Defects in Srams
AuthID
P-007-VXG
7
Author(s)
Chipana, R
·
Bolzani, L
·
Vargas, F
·
Semiao, J
·
Rodriguez Andina, J
·
Teixeira, I
·
Teixeira, P
Document Type
Proceedings Paper
Year published
2010
Published
in
Proceedings of the 2010 IEEE 16th International On-Line Testing Symposium, IOLTS 2010
Pages: 200-201
Conference
16Th Ieee International On-Line Testing Symposium, Iolts 2010,
Date:
5 July 2010 through 7 July 2010,
Location:
Corfu Island,
Sponsors:
IEEE;TTTC
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Publication Identifiers
DOI
:
10.1109/iolts.2010.5560207
SCOPUS
: 2-s2.0-77957992089
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