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Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits

AuthID
P-008-07Y

Author(s)

Freijedo, J

Rodriguez Andina, JJ

Document Type

Proceedings Paper

Year published

2011

Published

in LATW 2011 - 12th IEEE Latin-American Test Workshop

Conference

12Th Ieee Latin-American Test Workshop, Latw 2011, Date: 27 March 2011 through 30 March 2011, Location: Porto de Galinhas, Sponsors: SBU;CNPq;freescale

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Publication Identifiers

DOI: 10.1109/latw.2011.5985927

SCOPUS: 2-s2.0-80052617161

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Modeling the Effect of Process Variations on the Timing Response of Nanometer Digital Circuits

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