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Error Prediction and Detection Methodologies for Reliable Circuit Operation Under Nbti

AuthID
P-00K-457

Author(s)

Vazquez Hernandez, J

Champac, V

Dos Santos, MB

Document Type

Proceedings Paper

Year published

2014

Published

in Proceedings - International Test Conference, ISSN: 1089-3539

Volume: 2015-February

Conference

45Th Ieee International Test Conference, Itc 2014, Date: 21 October 2014 through 23 October 2014, Sponsors: IEEE Computer Society Test Technology Technical Council;IEEE Philadelphia Section

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Sources

Publication Identifiers

DOI: 10.1109/test.2014.7035364

Scopus: 2-s2.0-84954288366

Source Identifiers

ISSN: 1089-3539

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Error Prediction and Detection Methodologies for Reliable Circuit Operation Under Nbti

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