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From Etl Conceptual Design to Etl Physical Sketching Using Patterns
AuthID
P-00N-XPJ
2
Author(s)
Oliveira, B
·
Belo, O
4
Editor(s)
Hammoudi,S;Smialek,M;Camp,O;Filipe,J
Document Type
Proceedings Paper
Year published
2018
Published
in
Proceedings of the 20th International Conference on Enterprise Information Systems, ICEIS 2018, Funchal, Madeira, Portugal, March 21-24, 2018, Volume 1.
in
ICEIS (1),
ISSN: 2184-4992
Volume: 1, Pages: 262-269 (7)
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/en/publications/view/718546
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Metadata
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Publication Identifiers
DOI
:
10.5220/0006807702620269
DBLP
: conf/iceis/OliveiraB18
Handle
:
https://hdl.handle.net/1822/71904
SCOPUS
: 2-s2.0-85047770384
Source Identifiers
ISSN
: 2184-4992
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