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From Etl Conceptual Design to Etl Physical Sketching Using Patterns

AuthID
P-00N-XPJ

Author(s)

Oliveira, B

Belo, O

Editor(s)

Hammoudi,S;Smialek,M;Camp,O;Filipe,J

Document Type

Proceedings Paper

Year published

2018

Published

in Proceedings of the 20th International Conference on Enterprise Information Systems, ICEIS 2018, Funchal, Madeira, Portugal, March 21-24, 2018, Volume 1. in ICEIS (1), ISSN: 2184-4992

Volume: 1, Pages: 262-269 (7)

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Dblp^®/en/publications/view/718546

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Sources

Publication Identifiers

DOI: 10.5220/0006807702620269

Dblp: conf/iceis/OliveiraB18

Handle: https://hdl.handle.net/1822/71904

Scopus: 2-s2.0-85047770384

Source Identifiers

ISSN: 2184-4992

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