Peter Stallinga


AuthID: R-000-F4C

Confirmed Publications: 40



21
TITLE: Modeling electrical characteristics of thin-film field-effect transistors II: Effects of traps and impurities  Full Text
AUTHORS: Stallinga, P ; Gomes, HL ;
PUBLISHED: 2006, SOURCE: SYNTHETIC METALS, VOLUME: 156, ISSUE: 21-24
INDEXED IN: Scopus WOS
22
TITLE: Organic materials for active layers in transistors: Study of the electrical stability properties
AUTHORS: Gomes, HL ; Stallinga, P ; de Leeuw, DM;
PUBLISHED: 2006, SOURCE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, ISSUE: PART 1
INDEXED IN: Scopus WOS
IN MY: ORCID
23
TITLE: The effect of water related traps on the reliability of organic based transistors  Full Text
AUTHORS: Gomes, HL ; Stallinga, P ; Colle, M; Biscarini, F; de Leeuw, DM;
PUBLISHED: 2006, SOURCE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, ISSUE: 9-20
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
24
25
TITLE: Electrical characterization of organic based transistors: stability issues  Full Text
AUTHORS: Gomes, HL ; Stallinga, P ; Dinelli, F; Murgia, M; Biscarini, F; de Leeuw, DM; Muccini, M; Mullen, K;
PUBLISHED: 2005, SOURCE: 7th International Symposium on Polymers for Advanced Technologies in POLYMERS FOR ADVANCED TECHNOLOGIES, VOLUME: 16, ISSUE: 2-3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
26
TITLE: Meta-stability effects in organic based transistors
AUTHORS: Gomes, HL ; Stallinga, P ; Murgia, M; Biscarini, F; Muck, T; Wagner, V; Smits, E; De Leeuw, DM;
PUBLISHED: 2005, SOURCE: Organic Field-Effect Transistors IV in Proceedings of SPIE - The International Society for Optical Engineering, VOLUME: 5940
INDEXED IN: Scopus
27
TITLE: Trap states as an explanation for the Meyer-Neldel rule in semiconductors  Full Text
AUTHORS: Stallinga, P ; Gomes, HL ;
PUBLISHED: 2005, SOURCE: ORGANIC ELECTRONICS, VOLUME: 6, ISSUE: 3
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
28
TITLE: A microelectrode impedance method to measure interaction of cells
AUTHORS: Gomes, HL ; Leite, RB ; Afonso, R; Stallinga, P ; Cancela, ML ;
PUBLISHED: 2004, SOURCE: IEEE Sensors 2004 Conference in PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
29
TITLE: Bias-induced threshold voltages shifts in thin-film organic transistors  Full Text
AUTHORS: Gomes, HL ; Stallinga, P ; Dinelli, F; Murgia, M; Biscarini, F; de Leeuw, DM; Muck, T; Geurts, J; Molenkamp, LW; Wagner, V;
PUBLISHED: 2004, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 84, ISSUE: 16
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
30
TITLE: Detection of explosive vapors using organic thin-film transistors
AUTHORS: Bentes, E; Gomes, HL ; Stallinga, P ; Moura, L;
PUBLISHED: 2004, SOURCE: IEEE Sensors 2004 Conference in PROCEEDINGS OF THE IEEE SENSORS 2004, VOLS 1-3, VOLUME: 2
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
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