Jorge Filipe Leal Costa Semião


AuthID: R-001-F67

Confirmed Publications: 65



61
TITLE: Functional-oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage
AUTHORS: Guerreiro, F; Jorge Semião ; Pierce, A; M.B Santos; I.M Teixeira;
PUBLISHED: 2006, SOURCE: 2006 IEEE Design and Diagnostics of Electronic Circuits and systems
INDEXED IN: CrossRef
IN MY: ORCID
62
TITLE: Improving the tolerance of pipeline based circuits to power supply or temperature variations
AUTHORS: Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2005, SOURCE: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems in DFT 2007: 22ND IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS
INDEXED IN: WOS
IN MY: ORCID | ResearcherID
63
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
64
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus CrossRef
IN MY: ORCID
65
TITLE: Hardware/software specification, design and test using a system level approach
AUTHORS: DIas, OP; Jorge Semião ; Pereira, CE; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 12th Brazilian Symposium on Integrated Circuits and Systems Design, SBCCI 1999 in Proceedings - 12th Symposium on Integrated Circuits and Systems Design, SBCCI 1999
INDEXED IN: Scopus CrossRef
IN MY: ORCID
Page 7 of 7. Total results: 65.

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