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Santosh Pandey
AuthID:
R-00K-869
Publications
Confirmed
To Validate
Document Source:
All
Document Type:
All Document Types
Article (36)
Proceedings Paper (17)
Review (2)
Editorial Material (1)
Abstract (1)
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Order:
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Cit. WOS Dsc
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Cit. Scopus Dsc
IF Scopus Dsc
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Results:
10
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Confirmed Publications: 57
51
TITLE:
Characterization of a MEMS BioChip for planar patch-clamp recording
AUTHORS:
Santosh Pandey
; Rajiv Mehrotra;
Sherri Wykosky
; Marvin H White;
PUBLISHED:
2003
,
SOURCE:
2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings
INDEXED IN:
Scopus
CrossRef
IN MY:
ORCID
52
TITLE:
A planar MEMS bio-chip for recording ion-channel currents in biological cells
AUTHORS:
Santosh Pandey
; Zannatul Ferdous; Marvin H White;
PUBLISHED:
2002
,
SOURCE:
Proceedings of SPIE - The International Society for Optical Engineering,
VOLUME:
5062,
ISSUE:
2
INDEXED IN:
Scopus
Unpaywall
IN MY:
ORCID
53
TITLE:
Parameter-extraction of a two-compartment model for whole-cell data analysis
Full Text
AUTHORS:
Santosh Pandey
; White, MH;
PUBLISHED:
2002
,
SOURCE:
JOURNAL OF NEUROSCIENCE METHODS,
VOLUME:
120,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
:
2
Unpaywall
IN MY:
ORCID
54
TITLE:
An integrated planar patch-clamp system
AUTHORS:
Santosh Pandey
; White, MH;
PUBLISHED:
2001
,
SOURCE:
2001 INTERNATIONAL SEMICONDUCTOR DEVICE RESEARCH SYMPOSIUM, PROCEEDINGS
INDEXED IN:
Scopus
WOS
CrossRef
:
4
IN MY:
ORCID
55
TITLE:
A simple model for an Electrolyte-Oxide-Semiconductor pH sensor
AUTHORS:
Santosh Pandey
; Kal, S; Lahiri, SK;
PUBLISHED:
2000
,
SOURCE:
PROCEEDING OF THE TENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOLS I AND II,
VOLUME:
3975
INDEXED IN:
Scopus
WOS
IN MY:
ORCID
56
TITLE:
A simple model for extraction of interface state density of a Schottky barrier diode using reverse bias C-V plots
Full Text
AUTHORS:
Santosh Pandey
; Kal, S;
PUBLISHED:
2000
,
SOURCE:
INTERNATIONAL JOURNAL OF ELECTRONICS,
VOLUME:
87,
ISSUE:
2
INDEXED IN:
Scopus
WOS
CrossRef
Unpaywall
IN MY:
ORCID
57
TITLE:
A simple approach to the capacitance technique for determination of interface state density of a metal-semiconductor contact
AUTHORS:
Santosh Pandey
; Kal, S;
PUBLISHED:
1998
,
SOURCE:
SOLID-STATE ELECTRONICS,
VOLUME:
42,
ISSUE:
6
INDEXED IN:
Scopus
WOS
CrossRef
:
75
IN MY:
ORCID
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Page 6 of 6. Total results: 57.
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