ProfileOfResearchers

TITLE: Automatic adjustment of a medical imaging data acquisition system to unknown delays in the input communication channels
AUTHORS: Leong, C; Bexiga, V; Teixeira, JP ; Bugalho, R; Ferreira, M; Rodrigues, P; Silva, JC; Lousa, P; Varela, J ; Teixeira, IC ;
PUBLISHED: 2011, SOURCE: Analog Integrated Circuits and Signal Processing

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TITLE: Delay sensing for long-term variations and defects monitoring in safety-critical applications
AUTHORS: Vazquez, JC; Champac, V; Ziesemer, AM; Reis, R; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: Analog Integrated Circuits and Signal Processing

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TITLE: IP core to leverage RTOS-based embedded systems reliability to electromagnetic interference
AUTHORS: Silva, D; Poehls, LB; Jorge Semião ; Teixeira, IC ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2011, SOURCE: 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits, EMC COMPO 2011 in Proceedings of the 8th International Workshop on Electromagnetic Compatibility of Integrated Circuits 2011, EMC COMPO 2011

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TITLE: Lower V DD operation of FPGA-based digital circuits through delay modeling and time borrowing
AUTHORS: Freijedo, J; Valdes, MD; Costas, L; Moure, MJ; Rodriguez Andina, JJ; Jorge Semião ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: Journal of Low Power Electronics, VOLUME: 7, ISSUE: 2

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TITLE: Modeling the effect of process variations on the timing response of nanometer digital circuits
AUTHORS: Freijedo, J; Jorge Semião ; Rodriguez Andina, JJ; Vargas, F; Teixeira, IC ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop

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TITLE: On-line BIST for performance failure prediction under aging effects in automotive safety-critical applications
AUTHORS: Oliveira, RS; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: 12th IEEE Latin-American Test Workshop, LATW 2011 in LATW 2011 - 12th IEEE Latin-American Test Workshop

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TITLE: On-line BIST for performance failure prediction under NBTI-induced aging in safety-critical applications
AUTHORS: Oliveira, RS; Jorge Semião ; Teixeira, IC ; Santos, MB ; Teixeira, JP ;
PUBLISHED: 2011, SOURCE: Journal of Low Power Electronics, VOLUME: 7, ISSUE: 4

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TITLE: Performance failure prediction using built-in delay sensors in FPGAs
AUTHORS: Bexiga, V; Leong, C; Jorge Semião ; Ic Teixeira ; Teixeira, JP ; Valdes, M; Freijedo, J; Rodriguez Andina, JJ; Vargas, F;
PUBLISHED: 2011, SOURCE: 21st International Conference on Field Programmable Logic and Applications, FPL 2011 in Proceedings - 21st International Conference on Field Programmable Logic and Applications, FPL 2011

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