12
TITLE: Growth of aluminum oxide on silicon carbide with an atomically sharp interface
AUTHORS: Silva, AG ; Pedersen, K; Li, ZS; Hvam, J; Dhiman, R; Morgen, P;
PUBLISHED: 2017, SOURCE: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, VOLUME: 35, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
13
TITLE: Photoelectron spectroscopy as an in situ contact-less method for studies of MOS properties of ultrathin oxides on Si  Full Text
AUTHORS: Ana G Silva ; Kjeld Pedersen; Zheshen S S Li; Per Morgen;
PUBLISHED: 2015, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 353
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
15
TITLE: Influence of the patch field on work function measurements based on the secondary electron emission  Full Text
AUTHORS: Bundaleski, N ; Trigueiro, J; Silva, AG ; Moutinho, AMC ; Teodoro, OMND ;
PUBLISHED: 2013, SOURCE: JOURNAL OF APPLIED PHYSICS, VOLUME: 113, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef: 13
IN MY: ORCID
17
TITLE: Water on TiO2 studied by work function change: adsorption in cycles  Full Text
AUTHORS: Nenad Bundaleski ; Ana G Silva ; Bobbie Jean Shaw; Orlando Teodoro ; Augusto Moutinho ;
PUBLISHED: 2013, SOURCE: 15th International Conference on Thin Films (ICTF) in 15TH INTERNATIONAL CONFERENCE ON THIN FILMS (ICTF-15), VOLUME: 417, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
18
TITLE: Dynamics of water adsorption on TiO2 monitored by work function spectroscopy  Full Text
AUTHORS: Ana G Silva ; Nenad Bundaleski ; Augusto M C Moutinho ; Orlando M N D Teodoro ;
PUBLISHED: 2012, SOURCE: APPLIED SURFACE SCIENCE, VOLUME: 258, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID
19
TITLE: Novel Approach to the Semi-Empirical Universal Theory for Secondary Electron Yield  Full Text
AUTHORS: Bundaleski, N ; Shaw, BJ; Silva, AG ; Moutinho, AMC ; Teodoro, OMND ;
PUBLISHED: 2011, SOURCE: SCANNING, VOLUME: 33, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef: 2
IN MY: ORCID
20
TITLE: Oxidation of the surface of a thin amorphous silicon film  Full Text
AUTHORS: Ana G Silva ; Kjeld Pedersen; Zheshen S S Li; Per Morgen;
PUBLISHED: 2011, SOURCE: 18th International Vacuum Congress (IVC) in THIN SOLID FILMS, VOLUME: 520, ISSUE: 2
INDEXED IN: Scopus WOS CrossRef: 2
IN MY: ORCID
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