José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 100



81
TITLE: Using IEEE P1149.4
AUTHORS: J.S Matos; Machado da Silva, J ;
PUBLISHED: 1998, SOURCE: 1998 IEEE International Conference on Electronics, Circuits and Systems. Surfing the Waves of Science and Technology (Cat. No.98EX196)
INDEXED IN: CrossRef
IN MY: ORCID
82
TITLE: Implementation and evaluation of mixed current / voltage testing using the IEEE P1149.4 infrastructure
AUTHORS: Da Silva, JM ; Alves, JC ; Matos, JS ;
PUBLISHED: 1997, SOURCE: IEE Colloquium (Digest), ISSUE: 361
INDEXED IN: Scopus CrossRef
IN MY: ORCID
83
TITLE: Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure  Full Text
AUTHORS: da Silva, JM ; Leao, AC; Alves, JC ; Matos, JS;
PUBLISHED: 1997, SOURCE: International Test Conference 1997 (ITC) in ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY
INDEXED IN: Scopus WOS DBLP
84
TITLE: Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS: Machado da Silva, J ; Silva Matos, J ;
PUBLISHED: 1997, SOURCE: Proceedings of 1997 IEEE International Symposium on Circuits and Systems. Circuits and Systems in the Information Age ISCAS '97
INDEXED IN: CrossRef
IN MY: ORCID
85
TITLE: Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS: daSilva, JM ; Matos, JS;
PUBLISHED: 1997, SOURCE: 1997 IEEE International Symposium on Circuits and Systems (ISCAS 97) - Circuits and Systems in the Information Age in ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE, VOLUME: 4
INDEXED IN: Scopus WOS
IN MY: ORCID
86
TITLE: Evaluation of i(DD)/V-OUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits  Full Text
AUTHORS: daSilva, JM ; Matos, JS;
PUBLISHED: 1996, SOURCE: European Design and Test Conference in EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID
87
TITLE: Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits
AUTHORS: José Machado da Silva ; José Silva Matos ;
PUBLISHED: 1996, SOURCE: 1996 European Conference on Design and Test, EDTC 1996 in 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996
INDEXED IN: Scopus DBLP CrossRef: 1
IN MY: DBLP
88
TITLE: Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
AUTHORS: José Machado da Silva ; José Silva Matos; Ian M Bell; Gaynor E Taylor;
PUBLISHED: 1996, SOURCE: J. Electron. Test., VOLUME: 9, ISSUE: 1-2
INDEXED IN: DBLP
IN MY: DBLP
89
TITLE: Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
AUTHORS: DaSilva, JM ; Matos, JS ; Bell, IM; Taylor, GE;
PUBLISHED: 1996, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 9, ISSUE: 1-2
INDEXED IN: Scopus WOS
IN MY: ORCID
90
TITLE: Supply current test of analogue and mixed signal circuits
AUTHORS: Bell, IM; Spinks, SJ; daSilva, JM ;
PUBLISHED: 1996, SOURCE: IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, VOLUME: 143, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 21
IN MY: ORCID
Page 9 of 10. Total results: 100.

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