José Alberto Peixoto Machado da Silva


AuthID: R-000-7Z3

Confirmed Publications: 95



81
TITLE: Implementation of mixed current/voltage testing using the IEEE P1149.4 infrastructure  Full Text
AUTHORS: da Silva, JM ; Leao, AC; Alves, JC ; Matos, JS;
PUBLISHED: 1997, SOURCE: International Test Conference 1997 (ITC) in ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY
INDEXED IN: Scopus WOS
IN MY: ORCID
82
TITLE: Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS: daSilva, JM ; Matos, JS;
PUBLISHED: 1997, SOURCE: 1997 IEEE International Symposium on Circuits and Systems (ISCAS 97) - Circuits and Systems in the Information Age in ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE, VOLUME: 4
INDEXED IN: Scopus WOS
IN MY: ORCID
83
TITLE: Using power supply current monitoring and P1149.4 for parametric testing of passive components
AUTHORS: Machado da Silva, J ; Silva Matos, J ;
PUBLISHED: 1997, SOURCE: Proceedings of 1997 IEEE International Symposium on Circuits and Systems. Circuits and Systems in the Information Age ISCAS '97
INDEXED IN: CrossRef
IN MY: ORCID
84
TITLE: Evaluation of i(DD)/V-OUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits  Full Text
AUTHORS: daSilva, JM ; Matos, JS;
PUBLISHED: 1996, SOURCE: European Design and Test Conference in EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS
INDEXED IN: Scopus WOS
IN MY: ORCID
85
TITLE: Evaluation of iDD/vOUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits
AUTHORS: Machado Da Silva, J ; Silva Matos, J ;
PUBLISHED: 1996, SOURCE: 1996 European Conference on Design and Test, EDTC 1996 in Proceedings of the 1996 European Conference on Design and Test, EDTC 1996
INDEXED IN: Scopus CrossRef: 1
IN MY: ORCID
86
TITLE: Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits
AUTHORS: DaSilva, JM ; Matos, JS ; Bell, IM; Taylor, GE;
PUBLISHED: 1996, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 9, ISSUE: 1-2
INDEXED IN: Scopus WOS
IN MY: ORCID
87
TITLE: Supply current test of analogue and mixed signal circuits
AUTHORS: Bell, IM; Spinks, SJ; daSilva, JM ;
PUBLISHED: 1996, SOURCE: IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, VOLUME: 143, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 21
IN MY: ORCID
88
TITLE: Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS: daSilva, JM ; Matos, JS ; Bell, IM; Taylor, GE;
PUBLISHED: 1996, SOURCE: 38th Midwest Symposium on Circuits and Systems in 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2
INDEXED IN: WOS
IN MY: ORCID
89
TITLE: CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOG CIRCUITS
AUTHORS: DASILVA, JM ; MATOS, JS; BELL, IM; TAYLOR, GE;
PUBLISHED: 1995, SOURCE: ELECTRONICS LETTERS, VOLUME: 31, ISSUE: 19
INDEXED IN: Scopus WOS CrossRef: 9
IN MY: ORCID
90
TITLE: Use of power supply current and output voltage observation for testing large mixed-signal devices
AUTHORS: Machado M da Silva ; Silva S Matos ; Bell Ian, M; Taylor Gaynor, E;
PUBLISHED: 1995, SOURCE: Proceedings of the 1995 IEEE 38th Midwest Symposium on Circuits and Systems. Part 1 (of 2) in Midwest Symposium on Circuits and Systems, VOLUME: 2
INDEXED IN: Scopus CrossRef
IN MY: ORCID
Page 9 of 10. Total results: 95.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service