251
TITLE: Degradation of structural and optical properties of InGaN/GaN multiple quantum wells with increasing number of wells  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Barradas, NP ; Sequeira, AD; Franco, N; Watson, IM; Liu, C;
PUBLISHED: 2002, SOURCE: International Workshop on Nitride Semiconductors (IWN 2002) in INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS, PROCEEDINGS, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 3
252
TITLE: Low temperature photoluminescence, transient photoconductivity and microwave reflection for optical properties and transport in PLD-GaN  Full Text
AUTHORS: Niehus, M; Sanguino, P; Schwarz, R ; Monteiro, T ; Soares, MJ ; Pereira, E; Kunst, M; Koynov, S;
PUBLISHED: 2002, SOURCE: International Workshop on Nitride Semiconductors (IWN 2002) in INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS, PROCEEDINGS, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
253
TITLE: Analysis of strain depth variations in an In(0.19)Ga(0.81)N layer by Raman spectroscopy  Full Text
AUTHORS: Correia, MR ; Pereira, S ; Pereira, E; Frandon, J; Renucci, MA; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2002, SOURCE: International Workshop on Nitride Semiconductors (IWN 2002) in INTERNATIONAL WORKSHOP ON NITRIDE SEMICONDUCTORS, PROCEEDINGS, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 6
254
TITLE: Compositional pulling effects in InxGa1-x/GaN layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Trager Cowan, C; Sweeney, F; Alves, E ;
PUBLISHED: 2001, SOURCE: PHYSICAL REVIEW B, VOLUME: 64, ISSUE: 20
INDEXED IN: Scopus WOS CrossRef: 128
255
TITLE: Depth resolved studies of indium content and strain in InGaN layers  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Trager Cowan, C; Sweeney, F; Alves, E ; Sequeira, AD; Franco, N; Watson, IM;
PUBLISHED: 2001, SOURCE: 4th International Conference on Nitride Semiconductors (ICNS-4) in PHYSICA STATUS SOLIDI B-BASIC RESEARCH, VOLUME: 228, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 3
256
TITLE: Indium distribution within InxGa1-xN epitaxial layers: A combined resonant Raman scattering and Rutherford backscattering study  Full Text
AUTHORS: Correia, R; Pereira, S ; Pereira, E; Alves, E ; Gleize, J; Frandon, J; Renucci, MA;
PUBLISHED: 2001, SOURCE: 4th International Conference on Nitride Semiconductors (ICNS-4) in PHYSICA STATUS SOLIDI B-BASIC RESEARCH, VOLUME: 228, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef: 1
257
TITLE: Determination of biaxial modulus of chemical vapor-deposited diamond films  Full Text
AUTHORS: Fan, QH; Gracio, J ; Pereira, E; Teixeirae, V ; Tavares, CJ ;
PUBLISHED: 2001, SOURCE: 28th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 398
INDEXED IN: Scopus WOS CrossRef: 4
258
TITLE: Deflation for block eigenvalues of block partitioned matrices with an application to matrix polynomials of commuting matrices  Full Text
AUTHORS: Pereira, E; Vitoria, J;
PUBLISHED: 2001, SOURCE: 8th International Conference on Numerical Methods and Computational Mechanics (NMCM98) in COMPUTERS & MATHEMATICS WITH APPLICATIONS, VOLUME: 42, ISSUE: 8-9
INDEXED IN: Scopus WOS CrossRef: 3
259
TITLE: Interpretation of double x-ray diffraction peaks from InGaN layers  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Pereira, E; O'Donnell, KP; Alves, E ; Sequeira, AD; Franco, N;
PUBLISHED: 2001, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 79, ISSUE: 10
INDEXED IN: Scopus WOS CrossRef: 46
260
TITLE: Indium content determination related with structural and optical properties of InGaN layers  Full Text
AUTHORS: Pereira, S ; Correia, MR ; Monteiro, T ; Pereira, E; Soares, MR ; Alves, E ;
PUBLISHED: 2001, SOURCE: 4th European Workshop on Gallium Nitride in JOURNAL OF CRYSTAL GROWTH, VOLUME: 230, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef: 8
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