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TITLE: Radiation-induced structural transformations in a silicon layer of SOI  Full Text
AUTHORS: Shcherbachev, KD; Bublik, VT; Mordkovich, VN; Pazhin, DM; Alves, E ; Barradas, NP ;
PUBLISHED: 2007, SOURCE: 8th Biennial Conference on High Resolution X-Ray Diffraction and Imaging in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 204, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
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TITLE: The influence of in situ photoexcitation on a defect structure generation in Ar+ implanted GaAs(001) crystals revealed by high-resolution x-ray diffraction and Rutherford backscattering spectroscopy  Full Text
AUTHORS: Chtcherbatchev, KD; Bublik, VT; Markevich, AS; Mordkovich, VN; Alves, E ; Barradas, NP ; Sequeira, AD;
PUBLISHED: 2003, SOURCE: X-TOP 2002 Conference in JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, ISSUE: 10A
INDEXED IN: Scopus WOS CrossRef