81
TITLE: Secondary ion mass spectrometric investigation on ruthenium oxide systems: A comparison between poly- and nanocrystalline deposits  Full Text
AUTHORS: Barison, S; Barreca, D; Daolio, S; Fabrizio, M; Piccirillo, C;
PUBLISHED: 2000, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 14, ISSUE: 14
INDEXED IN: Scopus CrossRef
IN MY: ORCID
82
TITLE: Investigations on the formation of RuO2/ZrO2-based electrocatalytic thin films by surface analysis techniques  Full Text
AUTHORS: Kristof, J; Daolio, S; De Battisti, A; Piccirillo, C; Mihaly, J; Horvath, E;
PUBLISHED: 1999, SOURCE: LANGMUIR, VOLUME: 15, ISSUE: 4
INDEXED IN: Scopus WOS
83
TITLE: Secondary ion mass spectrometry characterization of IrO2-Ta2O5 thin films: Effect of relative composition on electrode properties  Full Text
AUTHORS: Daolio, S; De Battisti, A; Fabrizio, M; Nanni, L; Piccirillo, C;
PUBLISHED: 1998, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 12, ISSUE: 20
INDEXED IN: Scopus CrossRef
IN MY: ORCID
84
TITLE: Electroformed objects for jewelry: Secondary ion mass spectrometry characterization of Au films from CN-free electrolytes  Full Text
AUTHORS: Fabrizio, M; Piccirillo, C; Daolio, S;
PUBLISHED: 1998, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 12, ISSUE: 13
INDEXED IN: Scopus CrossRef
IN MY: ORCID
85
TITLE: SIMS characterization of noble metal-based thin film electrodes
AUTHORS: Piccirillo, C; Daolio, S; Gelosi, S; Pagura, C; Facchin, B; Kristof, J;
PUBLISHED: 1997, SOURCE: Materials Science Forum, VOLUME: 235-238, ISSUE: PART 2
INDEXED IN: Scopus
IN MY: ORCID
86
TITLE: Role of secondary ion mass spectrometric analysis in the brazing of precious alloys  Full Text
AUTHORS: Piccirillo, C; Fabrizio, M; Daolio, S; Facchin, B;
PUBLISHED: 1997, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 11, ISSUE: 12
INDEXED IN: Scopus CrossRef
IN MY: ORCID
87
TITLE: Hydrolytic reactions in hydrated iridium chloride coatings  Full Text
AUTHORS: Kristof, J; Mihaly, J; Daolio, S; DeBattisti, A; Nanni, L; Piccirillo, C;
PUBLISHED: 1997, SOURCE: JOURNAL OF ELECTROANALYTICAL CHEMISTRY, VOLUME: 434, ISSUE: 1-2
INDEXED IN: Scopus WOS
88
TITLE: Influence of support material on formation of electrocatalytic thin films - A secondary ion mass spectrometry study  Full Text
AUTHORS: Piccirillo, C; Daolio, S; Kristof, J; Mihaly, J; Facchin, B; Fabrizio, M;
PUBLISHED: 1997, SOURCE: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, VOLUME: 161, ISSUE: 1-3
INDEXED IN: Scopus WOS CrossRef
89
TITLE: Glass sample characterization by secondary ion mass spectrometry
AUTHORS: Daolio, S; Piccirillo, C; Pagura, C; Facchin, B; Zecchin, S; Venta, M;
PUBLISHED: 1996, SOURCE: Rapid Communications in Mass Spectrometry, VOLUME: 10, ISSUE: 10
INDEXED IN: Scopus CrossRef
IN MY: ORCID
90
TITLE: Investigation on the formation of RuO2 film electrode by secondary ion mass spectrometry  Full Text
AUTHORS: Kristof, J; Daolio, S; Piccirillo, C; Facchin, B; Mink, J;
PUBLISHED: 1996, SOURCE: SURFACE SCIENCE, VOLUME: 348, ISSUE: 3
INDEXED IN: Scopus WOS
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