61
TITLE: Quantitative Chemical Mapping of InGaN Quantum Wells from Calibrated High-Angle Annular Dark Field Micrographs
AUTHORS: Carvalho, D; Morales, FM; Ben, T; Garcia, R; Redondo Cubero, A; Alves, E; Lorenz, K; Edwards, PR; O'Donnell, KP; Wetzel, C;
PUBLISHED: 2015, SOURCE: MICROSCOPY AND MICROANALYSIS, VOLUME: 21, ISSUE: 4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
62
TITLE: Analysis of the stability of InGaN/GaN multiquantum wells against ion beam intermixing  Full Text
AUTHORS: Redondo Cubero, A; Lorenz, K; Wendler, E; Magalhaes, S; Alves, E; Carvalho, D; Ben, T; Morales, FM; Garcia, R; O'Donnell, KP; Wetzel, C;
PUBLISHED: 2015, SOURCE: NANOTECHNOLOGY, VOLUME: 26, ISSUE: 42
INDEXED IN: Scopus WOS
IN MY: ORCID
63
TITLE: Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams  Full Text
AUTHORS: Redondo-Cubero, A; Corregidor, V; Vázquez, L; L.C Alves;
PUBLISHED: 2015, SOURCE: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, VOLUME: 348
INDEXED IN: CrossRef
IN MY: ORCID
64
TITLE: Ion damage overrides structural disorder in silicon surface nanopatterning by low-energy ion beam sputtering
AUTHORS: Moreno-Barrado, A; Gago, R; Redondo-Cubero, A; Vázquez, L; Muñoz-García, J; Cuerno, R; Lorenz, K; Castro, M;
PUBLISHED: 2015, SOURCE: EPL - EPL (Europhysics Letters), VOLUME: 109, ISSUE: 4
INDEXED IN: CrossRef
IN MY: ORCID
65
TITLE: Nonuniversality due to inhomogeneous stress in semiconductor surface nanopatterning by low-energy ion-beam irradiation
AUTHORS: Moreno-Barrado, A; Castro, M; Gago, R; Vázquez, L; Muñoz-García, J; Redondo-Cubero, A; Galiana, B; Ballesteros, C; Cuerno, R;
PUBLISHED: 2015, SOURCE: Phys. Rev. B - Physical Review B, VOLUME: 91, ISSUE: 15
INDEXED IN: CrossRef
IN MY: ORCID
66
TITLE: Analysis of the stability of InGaN/GaN multiquantum wells against ion beam intermixing  Full Text
AUTHORS: Redondo-Cubero, A; Lorenz, K; Wendler, E; Magalhães, S; Alves, E; Carvalho, D; Ben, T; Morales, FM; García, R; O’Donnell, KP; Wetzel, C;
PUBLISHED: 2015, SOURCE: Nanotechnology, VOLUME: 26, ISSUE: 42
INDEXED IN: CrossRef
IN MY: ORCID
67
TITLE: Self-consistent depth profiling and imaging of GaN-based transistors using ion microbeams
AUTHORS: Redondo Cubero, A; Corregidor, V; Vázquez, L; Alves, LC;
PUBLISHED: 2015, SOURCE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 348
INDEXED IN: Scopus
IN MY: ORCID
68
TITLE: Native point defect energies, densities, and electrostatic repulsion across (Mg, Zn)O alloys. Point defect energies, densities, and electrostatic repulsion across (Mg,Zn)O
AUTHORS: Foster, GM; Perkins, J; Myer, M; Mehra, S; Chauveau, JM; Hierro, A; Redondo Cubero, A; Windl, W; Brillson, LJ;
PUBLISHED: 2015, SOURCE: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 212, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
69
TITLE: Impact of Mg content on native point defects in Mg<sub>x</sub>Zn<sub>1-x</sub>O (0 ≤ x ≤ 0.56)
AUTHORS: Perkins, J; Foster, GM; Myer, M; Mehra, S; Chauveau, JM; Hierro, A; Redondo Cubero, A; Windl, W; Brillson, LJ;
PUBLISHED: 2015, SOURCE: APL MATERIALS, VOLUME: 3, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef: 7
IN MY: ORCID
70
TITLE: Nonuniversality due to inhomogeneous stress in semiconductor surface nanopatterning by low-energy ion-beam irradiation
AUTHORS: Moreno-Barrado A.; Castro M.; Gago R.; Vázquez L.; Muñoz-García J.; Redondo-Cubero A.; Galiana B.; Ballesteros C.; Cuerno R.;
PUBLISHED: 2015, SOURCE: Physical Review B - Condensed Matter and Materials Physics, VOLUME: 91, ISSUE: 15
INDEXED IN: Scopus
IN MY: ORCID
Page 7 of 14. Total results: 137.