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TITLE: Combined grazing incidence RBS and TEM analysis of luminescent nano-SiGe/SiO2 multilayers  Full Text
AUTHORS: Kling, A ; Rodriguez, A; Sangrador, J; Ortiz, MI; Rodriguez, T; Ballesteros, C; Soares, JC ;
PUBLISHED: 2008, SOURCE: 18th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, ISSUE: 8
INDEXED IN: Scopus WOS CrossRef
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TITLE: Combined RBS and TEM characterization of nano-SiGe layers embedded in SiO2  Full Text
AUTHORS: Kling, A ; Ortiz, MI; Sangrador, J; Rodriguez, A; Rodriguez, T; BallesteroS, C; Soares, JC ;
PUBLISHED: 2006, SOURCE: 17th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 249, ISSUE: 1-2 SPEC. ISS.
INDEXED IN: Scopus WOS CrossRef
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TITLE: Growth by LPCVD, crystallization and characterization of SiGe nanoparticles for nanoelectronic devices  Full Text
AUTHORS: Ortiz, MI; Sangrador, J; Rodriguez, A; Rodriguez, T; Kling, A ; Franc, N; Barradas, NP ; Ballesteros, C;
PUBLISHED: 2006, SOURCE: International Conference on Trends in Nanotechnology in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 203, ISSUE: 6
INDEXED IN: Scopus WOS CrossRef
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TITLE: Ion beam analysis of the dry thermal oxidation of thin polycrystalline SiGe films  Full Text
AUTHORS: Kling, A ; Soares, JC ; Prieto, AC; Jimenez, J; Rodriguez, A; Sangrador, J; Rodriguez, T;
PUBLISHED: 2005, SOURCE: 8th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 240, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef
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TITLE: Solid-phase crystallization of amorphous SiGe films deposited by LPCVD on SiO2 and glass  Full Text
AUTHORS: Olivares, J; Rodriguez, A; Sangrador, J; Rodriguez, T; Ballesteros, C; Kling, A ;
PUBLISHED: 1999, SOURCE: THIN SOLID FILMS, VOLUME: 337, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef