Ph. Goudeau
AuthID: R-00F-BAB
1
TITLE: Effect of thermal treatments on the structure of MoNxOy thin films Full Text
AUTHORS: Cunha, L ; Rebouta, L ; Vaz, F ; Staszuk, M; Malara, S; Barbosa, J; Carvalho, P; Alves, E ; Le Bourhis, E; Ph. Goudeau; Riviere, JP;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
AUTHORS: Cunha, L ; Rebouta, L ; Vaz, F ; Staszuk, M; Malara, S; Barbosa, J; Carvalho, P; Alves, E ; Le Bourhis, E; Ph. Goudeau; Riviere, JP;
PUBLISHED: 2008, SOURCE: 5th Iberian Vacuum Meeting in VACUUM, VOLUME: 82, ISSUE: 12
2
TITLE: The effect of bombarding conditions on the properties of multifunctional Ti-C-O thin films grown by magnetron sputtering Full Text
AUTHORS: Fernandes, AC; Cunha, L ; Moura, C ; Vaz, F ; Carvalho, P; Le Bourhis, E; Ph. Goudeau; Riviere, JP; Parreira, NMG;
PUBLISHED: 2007, SOURCE: 34th International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 202, ISSUE: 4-7
AUTHORS: Fernandes, AC; Cunha, L ; Moura, C ; Vaz, F ; Carvalho, P; Le Bourhis, E; Ph. Goudeau; Riviere, JP; Parreira, NMG;
PUBLISHED: 2007, SOURCE: 34th International Conference on Metallurgical Coatings and Thin Films in SURFACE & COATINGS TECHNOLOGY, VOLUME: 202, ISSUE: 4-7
3
TITLE: The influence of structure changes in the properties of TiCxOy decorative thin films Full Text
AUTHORS: Fernandes, AC; Vaz, F ; Cunha, L ; Parreira, NMG; Cavaleiro, A ; Ph. Goudeau; Le Bourhis, E; Riviere, JP; Munteanu, D; Borcea, B; Cozma, R;
PUBLISHED: 2007, SOURCE: THIN SOLID FILMS, VOLUME: 515, ISSUE: 13
AUTHORS: Fernandes, AC; Vaz, F ; Cunha, L ; Parreira, NMG; Cavaleiro, A ; Ph. Goudeau; Le Bourhis, E; Riviere, JP; Munteanu, D; Borcea, B; Cozma, R;
PUBLISHED: 2007, SOURCE: THIN SOLID FILMS, VOLUME: 515, ISSUE: 13
4
TITLE: Influence of the O/C ratio in the behaviour of TiCxOy thin films Full Text
AUTHORS: Fernandes, AC; Vaz, F ; Rebouta, L ; Pinto, A; Alves, E ; Parreira, NMG; Ph. Goudeau; Le Bourhis, E; Riviere, JP;
PUBLISHED: 2007, SOURCE: 5th Asian/European International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 201, ISSUE: 9-11
AUTHORS: Fernandes, AC; Vaz, F ; Rebouta, L ; Pinto, A; Alves, E ; Parreira, NMG; Ph. Goudeau; Le Bourhis, E; Riviere, JP;
PUBLISHED: 2007, SOURCE: 5th Asian/European International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 201, ISSUE: 9-11
5
TITLE: Tribocorrosion behaviour of ZrOxNy thin films for decorative applications Full Text
AUTHORS: Ferreira, SC; Ariza, E ; Rocha, LA ; Gomes, JR ; Carvalho, P; Vaz, F ; Fernandes, AC; Rebouta, L ; Cunha, L ; Alves, E ; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 22-23
AUTHORS: Ferreira, SC; Ariza, E ; Rocha, LA ; Gomes, JR ; Carvalho, P; Vaz, F ; Fernandes, AC; Rebouta, L ; Cunha, L ; Alves, E ; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: Symposium on Protective Coatings and Thin Films held at the E-MRS Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 22-23
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TITLE: Structural evolution in ZrNxOy thin films as a function of temperature Full Text
AUTHORS: Cunha, L ; Vaz, F ; Moura, C ; Rebouta, L ; Carvalho, P; Alves, E ; Cavaleiro, A ; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 9
AUTHORS: Cunha, L ; Vaz, F ; Moura, C ; Rebouta, L ; Carvalho, P; Alves, E ; Cavaleiro, A ; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 9
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TITLE: Properties of MoNxOy thin films as a function of the N/O ratio Full Text
AUTHORS: Barbosa, J; Cunha, L ; Rebouta, L ; Moura, C ; Vaz, F ; Carvalho, S ; Alves, E ; Le Bourhis, E; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: 32nd International Conference on Metallurgical Coatings and Thin Film in THIN SOLID FILMS, VOLUME: 494, ISSUE: 1-2
AUTHORS: Barbosa, J; Cunha, L ; Rebouta, L ; Moura, C ; Vaz, F ; Carvalho, S ; Alves, E ; Le Bourhis, E; Goudeau, P; Riviere, JP;
PUBLISHED: 2006, SOURCE: 32nd International Conference on Metallurgical Coatings and Thin Film in THIN SOLID FILMS, VOLUME: 494, ISSUE: 1-2
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TITLE: Structural stability of decorative ZrNxOy thin films Full Text
AUTHORS: Carvalho, P; Vaz, F ; Rebouta, L ; Carvalho, S ; Cunha, L ; Goudeau, P; Riviere, JP; Alves, E ; Cavaleiro, A ;
PUBLISHED: 2005, SOURCE: 9th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 1-4
AUTHORS: Carvalho, P; Vaz, F ; Rebouta, L ; Carvalho, S ; Cunha, L ; Goudeau, P; Riviere, JP; Alves, E ; Cavaleiro, A ;
PUBLISHED: 2005, SOURCE: 9th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 200, ISSUE: 1-4
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TITLE: Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films Full Text
AUTHORS: Vaz, F ; Ferreira, J; Ribeiro, E; Rebouta, L ; Lanceros Mendez, S ; Mendes, JA ; Alves, E ; Goudeau, P; Riviere, JP; Ribeiro, F; Moutinho, I; Pischow, K; de Rijk, J;
PUBLISHED: 2005, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 191, ISSUE: 2-3
AUTHORS: Vaz, F ; Ferreira, J; Ribeiro, E; Rebouta, L ; Lanceros Mendez, S ; Mendes, JA ; Alves, E ; Goudeau, P; Riviere, JP; Ribeiro, F; Moutinho, I; Pischow, K; de Rijk, J;
PUBLISHED: 2005, SOURCE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 191, ISSUE: 2-3
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TITLE: Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage Full Text
AUTHORS: Vaz, F ; Carvalho, P; Cunha, L ; Rebouta, L ; Moura, C ; Alves, E ; Ramos, AR ; Cavaleiro, A ; Goudeau, P; Riviere, JP;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 469, ISSUE: SPEC. ISS.
AUTHORS: Vaz, F ; Carvalho, P; Cunha, L ; Rebouta, L ; Moura, C ; Alves, E ; Ramos, AR ; Cavaleiro, A ; Goudeau, P; Riviere, JP;
PUBLISHED: 2004, SOURCE: 31st International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 469, ISSUE: SPEC. ISS.
