Fernando Manuel Duarte Gonçalves
AuthID: R-000-51G
21
TITLE: Oat spelts xylan molecular mass estimation by size exclusion chromatography Full Text
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 3
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 3
22
TITLE: Radical initiated oxidative degradation of oat-spelts xylan Full Text
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 1
AUTHORS: Sarbu, A; Goncalves, F; de Pinho, MN ;
PUBLISHED: 2003, SOURCE: CARBOHYDRATE POLYMERS, VOLUME: 53, ISSUE: 1
23
TITLE: Property coverage for quality assessment of fault tolerant or fail safe systems
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: 9th IEEE International On-Line Testing Symposium in 9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: 9th IEEE International On-Line Testing Symposium in 9TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS
24
TITLE: Property coverage for quality assessment of fault tolerant or failsafe systems
AUTHORS: Gonçalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: 9th IEEE International On-Line Testing Symposium, IOLTS 2003 in Proceedings - 9th IEEE International On-Line Testing Symposium, IOLTS 2003
AUTHORS: Gonçalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2003, SOURCE: 9th IEEE International On-Line Testing Symposium, IOLTS 2003 in Proceedings - 9th IEEE International On-Line Testing Symposium, IOLTS 2003
INDEXED IN: 
Scopus
Scopus IN MY: 
ORCID
ORCID25
TITLE: Characterization of white wine mannoproteins Full Text
AUTHORS: Goncalves, F; Heyraud, A; De Pinho, MN ; Rinaudo, M;
PUBLISHED: 2002, SOURCE: JOURNAL OF AGRICULTURAL AND FOOD CHEMISTRY, VOLUME: 50, ISSUE: 21
AUTHORS: Goncalves, F; Heyraud, A; De Pinho, MN ; Rinaudo, M;
PUBLISHED: 2002, SOURCE: JOURNAL OF AGRICULTURAL AND FOOD CHEMISTRY, VOLUME: 50, ISSUE: 21
INDEXED IN: Scopus 
WOS
Scopus WOS26
TITLE: Optimisation of the method for determination of the temperature of saturation in wines Full Text
AUTHORS: dos Santos, PC; Goncalves, F; De Pinho, MN ;
PUBLISHED: 2002, SOURCE: 2nd In Vino Analytica Scientia Symposium in ANALYTICA CHIMICA ACTA, VOLUME: 458, ISSUE: 1
AUTHORS: dos Santos, PC; Goncalves, F; De Pinho, MN ;
PUBLISHED: 2002, SOURCE: 2nd In Vino Analytica Scientia Symposium in ANALYTICA CHIMICA ACTA, VOLUME: 458, ISSUE: 1
27
TITLE: Self-checking and fault tolerance quality assessment using Fault Sampling
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2002, SOURCE: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems in 17TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, VOLUME: 2002-January
28
TITLE: RTL design validation, DFT and test pattern generation for high defects coverage
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: IEEE European Test Workshop (ETW 01) in ETW 2001: IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS29
TITLE: Design and test of certifiable ASICs for safety-critical gas burners control
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS30
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS