Fernando Manuel Duarte Gonçalves
AuthID: R-000-51G
31
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: 
WOS
WOS32
TITLE: Teaching microelectronic-based integrated systems design and test
AUTHORS: Gonçalves, FM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
AUTHORS: Gonçalves, FM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 IEEE International Conference on Microelectronic Systems Education, MSE 1999 in Proceedings - 1999 IEEE International Conference on Microelectronic Systems Education: Systems Education in the 21st Century, MSE 1999
INDEXED IN: 
Scopus
Scopus33
TITLE: LAYOUT-LEVEL TECHNIQUES FOR TESTABILITY IMPROVEMENT OF MOS PHYSICAL DESIGNS
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
AUTHORS: SANTOS, MB; GONCALVES, FM; SOUSA, JJT; TEIXEIRA, JP;
PUBLISHED: 1991, SOURCE: 6TH MEDITERRANEAN ELECTROTECHNICAL CONF ( MELECON 91 ) in 6TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, PROCEEDINGS VOLS 1 AND 2
INDEXED IN: WOS
WOS34
TITLE: High-quality physical designs of CMOS ICs
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
AUTHORS: Sousa, JJT; Goncalves, FM; Teixeira, JP;
PUBLISHED: 1991, SOURCE: Euro ASIC 1991 in Euro ASIC 1991
INDEXED IN: Scopus
Scopus