N. Timneanu
AuthID: R-00G-AJE
1
TITLE: Soft x-ray free electron laser microfocus for exploring matter under extreme conditions Full Text
AUTHORS: Nelson, AJ; Toleikis, S; Chapman, H; Bajt, S; Krzywinski, J; Chalupsky, J; Juha, L; Cihelka, J; Hajkova, V; Vysin, L; Burian, T; Kozlova, M; Faeustlin, RR; Nagler, B; Vinko, SM; Whitcher, T; Dzelzainis, T; Renner, O; Saksl, K; Khorsand, AR; ...More
PUBLISHED: 2009, SOURCE: OPTICS EXPRESS, VOLUME: 17, ISSUE: 20
AUTHORS: Nelson, AJ; Toleikis, S; Chapman, H; Bajt, S; Krzywinski, J; Chalupsky, J; Juha, L; Cihelka, J; Hajkova, V; Vysin, L; Burian, T; Kozlova, M; Faeustlin, RR; Nagler, B; Vinko, SM; Whitcher, T; Dzelzainis, T; Renner, O; Saksl, K; Khorsand, AR; ...More
PUBLISHED: 2009, SOURCE: OPTICS EXPRESS, VOLUME: 17, ISSUE: 20