Kalyan Yoti Mitra
AuthID: R-00G-VCN
1
TITLE: Up-scaling of the manufacturing of all-inkjet-printed organic thin-film transistors: Device performance and manufacturing yield of transistor arrays Full Text
AUTHORS: Enrico Sowade; Kalyan Yoti Mitra; Eloi Ramon; Carme Martinez Domingo; Fulvia Villani; Fausta Loffredo; Henrique L Gomes; Reinhard R Baumann;
PUBLISHED: 2016, SOURCE: ORGANIC ELECTRONICS, VOLUME: 30
AUTHORS: Enrico Sowade; Kalyan Yoti Mitra; Eloi Ramon; Carme Martinez Domingo; Fulvia Villani; Fausta Loffredo; Henrique L Gomes; Reinhard R Baumann;
PUBLISHED: 2016, SOURCE: ORGANIC ELECTRONICS, VOLUME: 30
2
TITLE: All-inkjet-printed low-pass filters with adjustable cutoff frequency consisting of resistors, inductors and transistors for sensor applications Full Text
AUTHORS: Castro, HF; Correia, V; Sowade, E; Mitra, KY; Rocha, JG; Baumann, RR; Lanceros Mendez, S;
PUBLISHED: 2016, SOURCE: ORGANIC ELECTRONICS, VOLUME: 38
AUTHORS: Castro, HF; Correia, V; Sowade, E; Mitra, KY; Rocha, JG; Baumann, RR; Lanceros Mendez, S;
PUBLISHED: 2016, SOURCE: ORGANIC ELECTRONICS, VOLUME: 38
3
TITLE: All-inkjet-printed thin-film transistors: manufacturing process reliability by root cause analysis Full Text
AUTHORS: Enrico Sowade; Eloi Ramon; Kalyan Yoti Mitra; Carme Martinez Domingo; Marta Pedro; Jofre Pallares; Fausta Loffredo; Fulvia Villani; Henrique L Gomes; Lluis Teres; Reinhard R Baumann;
PUBLISHED: 2016, SOURCE: SCIENTIFIC REPORTS, VOLUME: 6
AUTHORS: Enrico Sowade; Eloi Ramon; Kalyan Yoti Mitra; Carme Martinez Domingo; Marta Pedro; Jofre Pallares; Fausta Loffredo; Fulvia Villani; Henrique L Gomes; Lluis Teres; Reinhard R Baumann;
PUBLISHED: 2016, SOURCE: SCIENTIFIC REPORTS, VOLUME: 6
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TITLE: All-inkjet printed organic transistors: Dielectric surface passivation techniques for improved operational stability and lifetime Full Text
AUTHORS: Gomes, HL; Medeiros, MCR; Villani, F; Canudo, J; Loffredo, F; Miscioscia, R; Martinez Domingo, C; Ramon, E; Sowade, E; Mitra, KY; Baumann, RR; McCulloch, I; Carrabina, J;
PUBLISHED: 2015, SOURCE: MICROELECTRONICS RELIABILITY, VOLUME: 55, ISSUE: 8
AUTHORS: Gomes, HL; Medeiros, MCR; Villani, F; Canudo, J; Loffredo, F; Miscioscia, R; Martinez Domingo, C; Ramon, E; Sowade, E; Mitra, KY; Baumann, RR; McCulloch, I; Carrabina, J;
PUBLISHED: 2015, SOURCE: MICROELECTRONICS RELIABILITY, VOLUME: 55, ISSUE: 8
