John Carulli Carulli Jr.
AuthID: R-00H-4F9
1
TITLE: A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits
AUTHORS: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLISHED: 2015, SOURCE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
AUTHORS: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLISHED: 2015, SOURCE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
INDEXED IN: 
Scopus 
DBLP
Scopus DBLP2
TITLE: A Fast Spatial Variation Modeling Algorithm for Efficient Test Cost Reduction of Analog/RF Circuits
AUTHORS: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLISHED: 2015, SOURCE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
AUTHORS: Hugo Goncalves; Xin Li; Miguel Correia ; Vitor Tavares ; John Carulli; Kenneth Butler;
PUBLISHED: 2015, SOURCE: Conference on Design Automation Test in Europe (DATE) in 2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)
INDEXED IN: 
WOS
WOS3
TITLE: Bayesian Model Fusion: Enabling Test Cost Reduction of Analog/RF Circuits via Wafer-level Spatial Variation Modeling Full Text
AUTHORS: Shanghang H Zhang; Xin Li; (Shawn) D Blanton; Jose Machado da Silva ; John M Carulli; Kenneth M Butler;
PUBLISHED: 2014, SOURCE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
AUTHORS: Shanghang H Zhang; Xin Li; (Shawn) D Blanton; Jose Machado da Silva ; John M Carulli; Kenneth M Butler;
PUBLISHED: 2014, SOURCE: 45th IEEE International Test Conference (ITC) in 2014 IEEE INTERNATIONAL TEST CONFERENCE (ITC), VOLUME: 2015-February
