1
TITLE: Local Binary Patterns for Document Forgery Detection
AUTHORS: Francisco Cruz; Nicolas Sidere; Mickaël Coustaty; Vincent Poulain D'Andecy; Jean Marc Ogier;
PUBLISHED: 2017, SOURCE: 14th IAPR International Conference on Document Analysis and Recognition, ICDAR 2017, Kyoto, Japan, November 9-15, 2017
INDEXED IN: DBLP