K. L. Grinvud
AuthID: R-00J-4WM
1
TITLE: Simultaneous layer-by-layer analysis of thin-film samples using mass-separated ion scattering, mass-spectrometry of secondary ions techniques and measuring the sample's full current obraztsa
AUTHORS: Tolstoguzov, AB; Grinvud, KL;
PUBLISHED: 2002, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 12
AUTHORS: Tolstoguzov, AB; Grinvud, KL;
PUBLISHED: 2002, SOURCE: Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, ISSUE: 12
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