João Paulo Cacho Teixeira
AuthID: R-000-7A4
211
TITLE: Design and test of certifiable ASICs for safety-critical gas burners control
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
AUTHORS: Goncalves, FM; Santos, MB; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 7th IEEE International On-Line Testing Workshop in SEVENTH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS
INDEXED IN: 
WOS
WOS212
TITLE: Test resource partitioning: a design & test issue
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
AUTHORS: Teixeira, JP; Teixeira, IM; Pereira, CE; Dias, OP; Jorge Semião ;
PUBLISHED: 2001, SOURCE: Design, Automation and Test in Europe Conference and Exhibition (DATE 2001) in DESIGN, AUTOMATION AND TEST IN EUROPE, CONFERENCE AND EXHIBITION 2001, PROCEEDINGS
213
TITLE: Biological monitoring of n-hexane exposure in Portuguese shoe manufacturing workers
AUTHORS: Mayan, O; Teixeira, JP; Pires, AF;
PUBLISHED: 2001, SOURCE: Applied Occupational and Environmental Hygiene, VOLUME: 16, ISSUE: 7
AUTHORS: Mayan, O; Teixeira, JP; Pires, AF;
PUBLISHED: 2001, SOURCE: Applied Occupational and Environmental Hygiene, VOLUME: 16, ISSUE: 7
INDEXED IN: 
Scopus
Scopus214
TITLE: Towards e-management as enabler for accelerated change
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
AUTHORS: Lérias, H; Luz, J; Moura, P; Mendes, A; Teixeira, I; Teixeira, JP;
PUBLISHED: 2001, SOURCE: 3rd International Conference on Enterprise Information Systems, ICEIS 2001 in ICEIS 2001 - Proceedings of the 3rd International Conference on Enterprise Information Systems, VOLUME: 2
INDEXED IN: Scopus
Scopus215
TITLE: RTL-based functional test generation for high defects coverage in digital SOCs
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
AUTHORS: Santos, MB; Goncalves, FM; Teixeira, IC; Teixeira, JP;
PUBLISHED: 2000, SOURCE: IEEE European Test Workshop in IEEE EUROPEAN TEST WORKSHOP, PROCEEDINGS
INDEXED IN: WOS
WOS216
TITLE: MOSYS: A methodology for automatic object identification from system specification
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
AUTHORS: Becker, LB; Pereira, CE; Dias, OP; Teixeira, IM; Teixeira, JP;
PUBLISHED: 2000, SOURCE: 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000 in Proceedings - 3rd IEEE International Symposium on Object-Oriented Real-Time Distributed Computing, ISORC 2000
INDEXED IN: Scopus 
CrossRef
Scopus CrossRef217
TITLE: Metrics and criteria for quality assessment of testable Hw Sw systems architectures Full Text
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
AUTHORS: Dias, OP; Teixeira, IC ; Teixeira, JP;
PUBLISHED: 1999, SOURCE: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, VOLUME: 14, ISSUE: 1-2
218
TITLE: Testability issues in the CMS ECAL upper-level readout and trigger system
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
AUTHORS: Almeida, CB; Teixeira, IC; Teixeira, JP; Varela, J; Augusto, J ; Santos, M; Cardoso, N;
PUBLISHED: 1999, SOURCE: 5th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE FIFTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS
INDEXED IN: WOS
WOS219
TITLE: From system level to defect-oriented test: A case study
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
AUTHORS: Dias, OP; Jorge Semião ; Santos, MB; Teixeira, IM; Teixeira, JP;
PUBLISHED: 1999, SOURCE: 1999 European Test Workshop, ETW 1999 in Proceedings - European Test Workshop 1999, ETW 1999
INDEXED IN: Scopus
Scopus220
TITLE: A concept and system architecture for IT-based Lifelong Learning Full Text
AUTHORS: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLISHED: 1998, SOURCE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, ISSUE: 2-3
AUTHORS: Encarnacao, J; Mengel, M; Bono, P; Bohm, K; Borgmeier, E; Brisson Lopes, J; Hornung, C; Knierriem Jasnoch, A; Koch, E; Kromer, D; Lindner, R; Paris, C; Sandberg, A; Schnaider, M; Storck, D; Teixeira, J; Urban, B; Wang, T;
PUBLISHED: 1998, SOURCE: COMPUTERS & GRAPHICS-UK, VOLUME: 22, ISSUE: 2-3
INDEXED IN: Scopus WOS
Scopus WOS