Delay-Fault Tolerance to Power Supply Voltage Disturbances Analysis in Nanometer Technologies

AuthID
P-003-SJ6
7
Author(s)
3
Editor(s)
Chatterjee, A; Nicolaidis, M; Santos, M
Document Type
Proceedings Paper
Year published
2009
Published
in 2009 15TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM in IEEE International On-Line Testing Symposium, ISSN: 1942-9398
Pages: 223-228 (6)
Conference
15Th Ieee International On-Line Testing Symposium, Date: JUN 24-26, 2009, Location: Sesimbra, PORTUGAL, Sponsors: IEEE
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-70449416225
Wos: WOS:000272962700046
Source Identifiers
ISSN: 1942-9398
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