Publications

Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

AuthID
P-004-QJM

Author(s)

Guerreiro, F

Pierce, A

Document Type

Proceedings Paper

Year published

2006

Published

in Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems

Volume: 2006, Pages: 279-284 (6)

Conference

9Th Ieee Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2006, Location: Prague, CZECH REPUBLIC, Sponsors: IEEE Comp Soc, TTTC, Czech Tech Univ

Indexing

Wos^®

Scopus^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/ddecs.2006.1649635

SCOPUS: 2-s2.0-33847120256

Wos: WOS:000238973400077

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

Useful Links

Get Help

Federated Authentication (Click on the image)

Functional-Oriented Bist of Sequential Circuits Aiming at Dynamic Faults Coverage

Useful Links

Get Help