Publications

AuthID
P-006-ABF

Author(s)

Vazquez, JC

Champac, V

Document Type

Article

Year published

2013

Published

in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174

Volume: 29, Issue: 3, Pages: 289-299 (11)

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Publication Identifiers

DOI: 10.1007/s10836-013-5358-z

SCOPUS: 2-s2.0-84880076511

Wos: WOS:000321520700005

Source Identifiers

ISSN: 0923-8174

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