Rtl Design Validation, Dft and Test Pattern Generation for High Defects Coverage

AuthID
 P-000-PVR
4
Author(s)
Document Type
Article
Year published
2002
Published
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 18, Issue: 2, Pages: 179-187 (9)
Conference
Ieee European Test Workshop (Etw 01), Date: MAY 29-JUN 01, 2001, Location: STOCKHOLM, SWEDEN, Sponsors: IEEE Comp Soc Test Technol Council, Linkoping Univ, Ericsson, Philips, Mentor Graph
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Publication Identifiers
Scopus: 2-s2.0-0036534503
Wos: WOS:000174987600009
Source Identifiers
ISSN: 0923-8174
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