Rtl-Based Functional Test Generation for High Defects Coverage in Digital Systems

AuthID
 P-000-VCD
4
Author(s)
1
Editor(s)
Prinetto P.Figueras J.
Document Type
Article
Year published
2001
Published
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 17, Issue: 3-4, Pages: 311-319 (9)
Conference
Ieee European Test Workshop, Date: MAY 23-26, 2000, Location: CASCAIS, PORTUGAL, Sponsors: IEEE Comp Soc, Test Technol Tech Council, Lisbon Tech Univ, Elect & Comp Engn Dept
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Publication Identifiers
SCOPUS: 2-s2.0-0035373022
Wos: WOS:000171796700013
Source Identifiers
ISSN: 0923-8174
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