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Vhdl Fault Simulation for Defect-Oriented Test and Diagnosis of Digital Ics
AuthID
P-001-F4Q
5
Author(s)
Celeiro, F
·
Dias, L
·
Ferreira, J
·
Santos, MB
·
Teixeira, JP
Document Type
Proceedings Paper
Year published
1996
Published
in
EURO-DAC '96 - EUROPEAN DESIGN AUTOMATION CONFERENCE WITH EURO-VHDL '96 AND EXHIBITION, PROCEEDINGS
Pages: 450-455 (6)
Conference
European Design Automation Conference (Euro-Dac 96), with Euro-Vhdl 96 and Exhibition,
Date:
SEP 16-20, 1996,
Location:
GENEVA, SWITZERLAND,
Sponsors:
Gesell Informat e V, IEEE, Comp Soc, Tech Comm Design Automat, IEEE, Circuits & Syst Soc, Assoc Comp Machinery, Special Interest Grp Design Automat, IFIP 10.5, EDAC, CEPIS, European C A D Standardizat Initiat, Osterreich Comp Gesell, Schweizer Informat Gesell
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Publication Identifiers
SCOPUS
: 2-s2.0-0029767124
Wos
: WOS:A1996BG47Z00068
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