Test Preparation Methodology for High Coverage of Physical Defects in Cmos Digital Ics

AuthID
P-001-HMQ
Document Type
Proceedings Paper
Year published
1995
Published
in EUROPEAN DESIGN AND TEST CONFERENCE - ED&TC 1995, PROCEEDINGS in EUROPEAN CONFERENCE ON DESIGN AUTOMATION, ISSN: 1066-1409
Pages: 604-604 (1)
Conference
European Design and Test Conference (Ed&Tc 1995), Date: MAR 06-09, 1995, Location: PARIS, FRANCE, Sponsors: IEEE, COMP SOC, EDA ASSOC, EUROPEAN GRP TTTC & DATC, ASSOC COMP MACHINERY, SPECIAL INTEREST GRP DESIGN AUTOMAT
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Publication Identifiers
Wos: WOS:A1995BC60C00108
Source Identifiers
ISSN: 1066-1409
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