Publications

Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-Vdd Test

AuthID
P-000-6YE

Author(s)

Rodriguez Irago, M

Document Type

Proceedings Paper

Year published

2005

Published

in 11th IEEE International On-Line Testing Symposium

Volume: 2005, Pages: 281-286 (6)

Conference

11Th Ieee International On-Line Testing Symposium, Date: JUL 06-08, 2005, Location: St Raphael, FRANCE, Sponsors: IEEE Comp Soc, Test Technol Tech Council

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Publication Identifiers

DOI: 10.1109/iolts.2005.25

Scopus: 2-s2.0-33745490052

Wos: WOS:000231055600054

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