Publications

Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

AuthID
P-002-WZ8

Author(s)

Martins, CV

Vazquez, JC

Document Type

Proceedings Paper

Year published

2011

Published

in 2011 IEEE 29TH VLSI TEST SYMPOSIUM (VTS) in IEEE VLSI Test Symposium, ISSN: 1093-0167

Pages: 203-208 (6)

Conference

29Th Ieee Vlsi Test Symposium (Vts)/Workshop on Design for Reliability and Variability (Drv), Date: MAY 01-05, 2011, Location: Dana Point, CA, Sponsors: IEEE, IEEE Comp Soc, IEEE Comp Soc Test Technol Tech Council

Indexing

Wos^®

Scopus^®

Crossref^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1109/vts.2011.5783784

Scopus: 2-s2.0-79959649877

Wos: WOS:000300521100038

Source Identifiers

ISSN: 1093-0167

Export Publication Metadata

Marked List

Add to Marked List

Info

At this moment we don't have any links to full text documens.

Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

Useful Links

Get Help

Federated Authentication (Click on the image)

Adaptive Error-Prediction Flip-Flop for Performance Failure Prediction with Aging Sensors

Useful Links

Get Help