Pedro Manuel Brito da Silva Girão
AuthID: R-000-EV7
261
TÃTULO: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM:
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ORCID

262
TÃTULO: Microcontroller - based data processing for non-linear measuring sensors
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Postolache, O; Silva Girão, P; Dias Pereira, JM; Fosalau, C;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM:
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ORCID

263
TÃTULO: Laser based smart displacement sensor
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
AUTORES: Postolache O.; Pereira M.; Girão P.;
PUBLICAÇÃO: 2001, FONTE: SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference
264
TÃTULO: Minimizing temperature drift errors of conditioning circuits using artificial neural networks
AUTORES: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLICAÇÃO: 2000, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, NÚMERO: 5
AUTORES: Pereira, JMD; Postolache, O ; Girao, PMBS; Cretu, M;
PUBLICAÇÃO: 2000, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 49, NÚMERO: 5
265
TÃTULO: Metrological quality of measured and evaluated values using automated measuring systems
AUTORES: Girao, PMBS;
PUBLICAÇÃO: 2000, FONTE: Conference on Precision Electromagnetic Measurements (CPEM 2000) in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
AUTORES: Girao, PMBS;
PUBLICAÇÃO: 2000, FONTE: Conference on Precision Electromagnetic Measurements (CPEM 2000) in 2000 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST
INDEXADO EM:
Scopus
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266
TÃTULO: Automated characterization of a bifurcated optical fiber bundle displacement sensor taking into account reflector tilting perturbation effects
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
AUTORES: Brandão Faria, J; Octavian Postolache; Dias Pereira, J; Silva Girão, P;
PUBLICAÇÃO: 2000, FONTE: Microwave and Optical Technology Letters, VOLUME: 26, NÚMERO: 4
267
TÃTULO: Dithered ADC systems in the presence of hysteresis errors Full Text
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
AUTORES: Pereira, JMD; Serra, AC ; Girao, PS;
PUBLICAÇÃO: 1999, FONTE: 16th IEEE Instrumentation and Measurement Technology Conference in IMTC/99: PROCEEDINGS OF THE 16TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS. 1-3, VOLUME: 3
INDEXADO EM:
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ORCID

268
TÃTULO: Electromagnetic compatibility: Aspects involved in the certification of products
AUTORES: Girao, PMBD;
PUBLICAÇÃO: 1998, FONTE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2, VOLUME: 1
AUTORES: Girao, PMBD;
PUBLICAÇÃO: 1998, FONTE: 9th Mediterranean Electrotechnical Conference (Melecon 98) in MELECON '98 - 9TH MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1 AND 2, VOLUME: 1
INDEXADO EM:
Scopus
WOS


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ORCID

269
TÃTULO: Taxonomic problems on ADC characterization
AUTORES: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
AUTORES: Carneiro C Martins; Geirinhas G Ramos ; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 5th IEEE International Conference on Electronics, Circuits and Systems (ICECS'98) - Surfing the Waves of Science and Technology in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, VOLUME: 3
INDEXADO EM:
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ORCID

270
TÃTULO: New virtual instrument for temperature measurement based on a photodiode excited by a laser source
AUTORES: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
AUTORES: Postolache, O ; Dias M D Pereira; Silva S Girao; Cruz C Serra;
PUBLICAÇÃO: 1998, FONTE: Proceedings of the 1998 9th Mediterranean Electrotechnical Conference, MELECON. Part 2 (of 2) in Proceedings of the Mediterranean Electrotechnical Conference - MELECON, VOLUME: 2
INDEXADO EM:
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ORCID
