Pedro Miguel Pinto Ramos
AuthID: R-000-F0Z
21
TÃTULO: Pulsed eddy currents testing using a planar matrix probe
AUTORES: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 77
AUTORES: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 77
22
TÃTULO: Uncertainty evaluation of multivariate quantities: A case study on electrical impedance
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
23
TÃTULO: Vector fitting based automatic circuit identification Full Text
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
24
TÃTULO: Cloud base height measurement system based on stereo vision with automatic calibration Full Text
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
25
TÃTULO: A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization Full Text
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
26
TÃTULO: Cloud Base Height Measurement System Based on Stereo Vision with Automatic Calibration
AUTORES: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: 
WOS
WOS NO MEU: 
ORCID
ORCID27
TÃTULO: A Comparative Analysis between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization
AUTORES: Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: WOS
WOS NO MEU: ORCID
ORCID28
TÃTULO: Vector Fitting based Automatic Circuit Identification
AUTORES: Pedro M Ramos; Fernando M Janeiro;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Pedro M Ramos; Fernando M Janeiro;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: WOS
WOS NO MEU: ORCID
ORCID29
TÃTULO: Portable Embedded System for Contactless Measurement of Material Conductivity
AUTORES: Nuno Rodrigues; Luis Rosado; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in PROCEEDINGS OF THE 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT AND 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
AUTORES: Nuno Rodrigues; Luis Rosado; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in PROCEEDINGS OF THE 21ST IMEKO TC-4 INTERNATIONAL SYMPOSIUM ON UNDERSTANDING THE WORLD THROUGH ELECTRICAL AND ELECTRONIC MEASUREMENT AND 19TH INTERNATIONAL WORKSHOP ON ADC MODELLING AND TESTING
INDEXADO EM: WOS
WOS NO MEU: ORCID
ORCID30
TÃTULO: A new dual driver planar eddy current probe with dynamically controlled induction pattern Full Text
AUTORES: Luis S Rosado; Telmo G Santos ; Pedro M Ramos; Pedro Vilaca; Moises Piedade;
PUBLICAÇÃO: 2015, FONTE: NDT & E INTERNATIONAL, VOLUME: 70
AUTORES: Luis S Rosado; Telmo G Santos ; Pedro M Ramos; Pedro Vilaca; Moises Piedade;
PUBLICAÇÃO: 2015, FONTE: NDT & E INTERNATIONAL, VOLUME: 70
