Pedro Miguel Pinto Ramos
AuthID: R-000-F0Z
21
TÃTULO: A portable embedded contactless system for the measurement of metallic material conductivity and lift-off
AUTORES: Rodrigues, NM; Rosado, LS; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in MEASUREMENT, VOLUME: 111
AUTORES: Rodrigues, NM; Rosado, LS; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 21st IMEKO TC-4 International Symposium on Understanding the World through Electrical and Electronic Measurement / 19th International Workshop on ADC Modelling and Testing in MEASUREMENT, VOLUME: 111
22
TÃTULO: Low pass digital filter delay compensation for accurate zero cross detection in power quality
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
INDEXADO EM: 
Scopus
Scopus23
TÃTULO: Pulsed eddy currents testing using a planar matrix probe
AUTORES: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 77
AUTORES: Ruben F Abrantes; Luis S Rosado; Moises Piedade; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 77
24
TÃTULO: Uncertainty evaluation of multivariate quantities: A case study on electrical impedance
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
25
TÃTULO: Vector fitting based automatic circuit identification Full Text
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
26
TÃTULO: Cloud base height measurement system based on stereo vision with automatic calibration Full Text
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
27
TÃTULO: A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization Full Text
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
28
TÃTULO: Cloud Base Height Measurement System Based on Stereo Vision with Automatic Calibration
AUTORES: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Fernando M Janeiro; Filipe Carretas; Pedro M Ramos; Frank Wagner;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: 
WOS
WOS NO MEU: 
ORCID
ORCID29
TÃTULO: A Comparative Analysis between Genetic Algorithms and Complex Nonlinear Least Squares on Electrical Impedance Characterization
AUTORES: Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Fernando M Janeiro; Pedro M Ramos;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: WOS
WOS NO MEU: ORCID
ORCID30
TÃTULO: Vector Fitting based Automatic Circuit Identification
AUTORES: Pedro M Ramos; Fernando M Janeiro;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
AUTORES: Pedro M Ramos; Fernando M Janeiro;
PUBLICAÇÃO: 2016, FONTE: IEEE International Instrumentation and Measurement Technology Conference (I2MTC) in 2016 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE PROCEEDINGS
INDEXADO EM: WOS
WOS NO MEU: ORCID
ORCID