Luis Alexandre Machado da Rocha
AuthID: R-000-M11
91
TÃTULO: Pull-in dynamics: Analysis and modeling of the transitional regime
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, AF;
PUBLICAÇÃO: 2004, FONTE: 17th IEEE International Conference on Micro Electro Mechanical Systems in MEMS 2004: 17TH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST
INDEXADO EM: 
WOS
WOS NO MEU: ResearcherID
ResearcherID92
TÃTULO: Analytical model for the pull-in time of low-Q MEMS devices
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2004, FONTE: Nanotechnology Conference and Trade Show (Nanotech 2004) in NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS
INDEXADO EM: WOS
WOS NO MEU: ResearcherID
ResearcherID93
TÃTULO: Stability of a micromechanical pull-in voltage reference
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, NÚMERO: 2
AUTORES: Rocha, LA; Cretu, E; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: Conference on Precision Electromagnetic Measurements (CPEM 2002) in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 52, NÚMERO: 2
NO MEU: 
ORCID | ResearcherID
ORCID | ResearcherID94
TÃTULO: Performance of integrated silicon infrared microspectrometers
AUTORES: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
AUTORES: Kong, SH; de Graaf, G; Roche, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2003, FONTE: 20th IEEE Instrumentation and Measurement Technology Conference in IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2
INDEXADO EM: WOS
WOS NO MEU: ResearcherID
ResearcherID95
TÃTULO: Micromechanical voltage reference using the pull-in of a beam
AUTORES: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2001, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, NÚMERO: 6
AUTORES: Cretu, E; Rocha, LA; Wolffenbuttel, RF;
PUBLICAÇÃO: 2001, FONTE: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOLUME: 50, NÚMERO: 6
NO MEU: ORCID | ResearcherID
ORCID | ResearcherID