C. Jeynes
AuthID: R-006-GF6
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TÃTULO: Accurate simulation of backscattering spectra in the presence of sharp resonances Full Text
AUTORES: Barradas, NP ; Alves, E ; Jeynes, C; Tosaki, M;
PUBLICAÇÃO: 2006, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 247, NÚMERO: 2
AUTORES: Barradas, NP ; Alves, E ; Jeynes, C; Tosaki, M;
PUBLICAÇÃO: 2006, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 247, NÚMERO: 2
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TÃTULO: A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films Full Text
AUTORES: Barradas, NP ; Added, N; Arnoldbik, WM; Bogdanovic Radovic, I; Bohne, W; Cardoso, S ; Danner, C; Dytlewski, N; Freitas, PP ; Jaksic, M; Jeynes, C; Krug, C; Lennard, WN; Lindner, S; Linsmeier, C; Medunic, Z; Pelicon, P; Pezzi, RP; Radtke, C; Rohrich, J; ...Mais
PUBLICAÇÃO: 2005, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 227, NÚMERO: 3
AUTORES: Barradas, NP ; Added, N; Arnoldbik, WM; Bogdanovic Radovic, I; Bohne, W; Cardoso, S ; Danner, C; Dytlewski, N; Freitas, PP ; Jaksic, M; Jeynes, C; Krug, C; Lennard, WN; Lindner, S; Linsmeier, C; Medunic, Z; Pelicon, P; Pezzi, RP; Radtke, C; Rohrich, J; ...Mais
PUBLICAÇÃO: 2005, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 227, NÚMERO: 3
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TÃTULO: Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool Full Text
AUTORES: Jeynes, C; Barradas, NP ; Marriott, PK; Boudreault, G; Jenkin, M; Wendler, E; Webb, RP;
PUBLICAÇÃO: 2003, FONTE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, NÚMERO: 7
AUTORES: Jeynes, C; Barradas, NP ; Marriott, PK; Boudreault, G; Jenkin, M; Wendler, E; Webb, RP;
PUBLICAÇÃO: 2003, FONTE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 36, NÚMERO: 7
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TÃTULO: Accurate determination of the stopping power of He-4 in Si using Bayesian inference Full Text
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLICAÇÃO: 2002, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 194, NÚMERO: 1
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLICAÇÃO: 2002, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 194, NÚMERO: 1
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TÃTULO: Applying elastic backscattering spectrometry when the nuclear excitation function has a fine structure Full Text
AUTORES: Gurbich, AF; Barradas, NP ; Jeynes, C; Wendler, E;
PUBLICAÇÃO: 2002, FONTE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, NÚMERO: 1-4
AUTORES: Gurbich, AF; Barradas, NP ; Jeynes, C; Wendler, E;
PUBLICAÇÃO: 2002, FONTE: 15th International Conference on Ion-Beam Analysis (IBA-15) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 190, NÚMERO: 1-4
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TÃTULO: Determination of stopping power of ions in matter
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLICAÇÃO: 2001, FONTE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP; Wendler, E;
PUBLICAÇÃO: 2001, FONTE: International Conference on Advanced Monte Carlo for Radiation Physics, Particle Transport Simulation and Applications in ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS
INDEXADO EM: WOS
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TÃTULO: Rutherford backscattering spectrometry and computer simulation for the in-depth analysis of chemically modified poly(vinylidene fluoride) Full Text
AUTORES: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLICAÇÃO: 2001, FONTE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, NÚMERO: 19
AUTORES: Ross, GJ; Barradas, NP ; Hill, MP; Jeynes, C; Morrissey, P; Watts, JF;
PUBLICAÇÃO: 2001, FONTE: JOURNAL OF MATERIALS SCIENCE, VOLUME: 36, NÚMERO: 19
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TÃTULO: Error performance analysis of artificial neural networks applied to Rutherford backscattering Full Text
AUTORES: Vieira, A; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 2001, FONTE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 31, NÚMERO: 1
AUTORES: Vieira, A; Barradas, NP ; Jeynes, C;
PUBLICAÇÃO: 2001, FONTE: SURFACE AND INTERFACE ANALYSIS, VOLUME: 31, NÚMERO: 1
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TÃTULO: Accurate depth profiling of complex optical coatings Full Text
AUTORES: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1
AUTORES: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1
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TÃTULO: Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data Full Text
AUTORES: Jeynes, C; Barradas, NP ; Wilde, JR; Greer, AL;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161
AUTORES: Jeynes, C; Barradas, NP ; Wilde, JR; Greer, AL;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161