António Manuel Cruz Serra
AuthID: R-000-28E
21
TÃTULO: Measuring channel switching error in data acquisition systems
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: 
Scopus
Scopus22
TÃTULO: Stochastic approach for memoryless nonlinearity measurements
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus23
TÃTULO: Measuring channel switching error in data acquisition systems
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus24
TÃTULO: Stochastic approach for memoryless nonlinearity measurements
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Martins, RC; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus NO MEU: 
ORCID
ORCID25
TÃTULO: Measuring channel switching error in data acquisition systems
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Corrêa Alegria, F; Ramos, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID26
TÃTULO: A frequency-domain approach to ADC phase-plane modeling and testing
AUTORES: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
AUTORES: Monteiro, CL; Arpaia, P; Serra, AC;
PUBLICAÇÃO: 2003, FONTE: 8th International Workshop on ADC Modelling and Testing, IWADC 2003 in Proceedings of the 8th International Workshop on ADC Modelling and Testing, IWADC 2003
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID27
TÃTULO: A new robust four parameter sine fitting procedure
AUTORES: Da Silva, MF; Serra, AC;
PUBLICAÇÃO: 2002, FONTE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
AUTORES: Da Silva, MF; Serra, AC;
PUBLICAÇÃO: 2002, FONTE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID28
TÃTULO: New trends in analog to digital converters testing
AUTORES: Serra, AC;
PUBLICAÇÃO: 2002, FONTE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
AUTORES: Serra, AC;
PUBLICAÇÃO: 2002, FONTE: 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 in 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID29
TÃTULO: Impedance measurement using sine fitting algorithms
AUTORES: Manuel Fonseca da Silva; Pedro Miguel Ramos; António Manuel da Cruz Serra;
PUBLICAÇÃO: 2002, FONTE: 12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation
AUTORES: Manuel Fonseca da Silva; Pedro Miguel Ramos; António Manuel da Cruz Serra;
PUBLICAÇÃO: 2002, FONTE: 12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID30
TÃTULO: Extending digital input/output capabilities to low-cost and NON-linear a/d conversion
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
AUTORES: Dias Pereira, JM; Postolache, O; Cruz Serra, A; Silva Girão, P;
PUBLICAÇÃO: 2001, FONTE: 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001 in 11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation and 6th IMEKO TC4 Workshop on ADC Modelling and Testing 2001
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID