C. Buchal
AuthID: R-00F-A3Z
1
TÃTULO: Annealing of BaTiO3 thin films after heavy ion implantation Full Text
AUTORES: Dietrich, M; Buchal, C; Correia, JG ; Deicher, M; Schmid, M; Uhrmacher, M; Vetter, U; Wahl, U ;
PUBLICAÇÃO: 2004, FONTE: Symposium on Ion Beams for Nanoscale Surface Modifications held as the European-Materials-Research-Society in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 216, NÚMERO: 1-4
AUTORES: Dietrich, M; Buchal, C; Correia, JG ; Deicher, M; Schmid, M; Uhrmacher, M; Vetter, U; Wahl, U ;
PUBLICAÇÃO: 2004, FONTE: Symposium on Ion Beams for Nanoscale Surface Modifications held as the European-Materials-Research-Society in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 216, NÚMERO: 1-4
