Fernando Manuel Tim Tim Janeiro
AuthID: R-000-52M
11
TÃTULO: Peak factor optimization of multi-harmonic signals using artificial bee colony algorithm Full Text
AUTORES: Janeiro, FM; Hu, YY; Ramos, PM;
PUBLICAÇÃO: 2020, FONTE: MEASUREMENT, VOLUME: 150
AUTORES: Janeiro, FM; Hu, YY; Ramos, PM;
PUBLICAÇÃO: 2020, FONTE: MEASUREMENT, VOLUME: 150
12
TÃTULO: Digital filter performance for zero crossing detection in power quality embedded measurement systems
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2018, FONTE: 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 in I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2018, FONTE: 2018 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018 in I2MTC 2018 - 2018 IEEE International Instrumentation and Measurement Technology Conference: Discovering New Horizons in Instrumentation and Measurement, Proceedings
13
TÃTULO: Comparison of harmonic estimation methods for power quality assessment Full Text
AUTORES: Rodrigues, NM; Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2018, FONTE: 22nd World Congress of the International Measurement Confederation, IMEKO 2018 in Journal of Physics: Conference Series, VOLUME: 1065, NÚMERO: 5
AUTORES: Rodrigues, NM; Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2018, FONTE: 22nd World Congress of the International Measurement Confederation, IMEKO 2018 in Journal of Physics: Conference Series, VOLUME: 1065, NÚMERO: 5
14
TÃTULO: Threshold estimation for least-squares fitting in impedance spectroscopy
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2018, FONTE: MEASUREMENT, VOLUME: 124
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2018, FONTE: MEASUREMENT, VOLUME: 124
15
TÃTULO: Low pass digital filter delay compensation for accurate zero cross detection in power quality
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
AUTORES: Rodrigues, NM; Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
INDEXADO EM: 
Scopus
Scopus NO MEU: 
ORCID
ORCID16
TÃTULO: Artificial bee colony algorithm for peak-to-peak factor minimization in periodic signals
AUTORES: Hu, Y; Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
AUTORES: Hu, Y; Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2017, FONTE: 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements in 22nd IMEKO TC4 International Symposium and 20th International Workshop on ADC Modelling and Testing 2017: Supporting World Development Through Electrical and Electronic Measurements, VOLUME: 2017-September
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID17
TÃTULO: Uncertainty evaluation of multivariate quantities: A case study on electrical impedance
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
AUTORES: Pedro M Ramos; Fernando M Janeiro; Pedro S Girao;
PUBLICAÇÃO: 2016, FONTE: MEASUREMENT, VOLUME: 78
18
TÃTULO: Vector fitting based automatic circuit identification Full Text
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Ramos, PM; Janeiro, FM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
19
TÃTULO: Cloud base height measurement system based on stereo vision with automatic calibration Full Text
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM; Carretas, F; Wagner, F;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
20
TÃTULO: A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization Full Text
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
AUTORES: Janeiro, FM; Ramos, PM;
PUBLICAÇÃO: 2016, FONTE: 2016 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016 in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2016-July
