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TÍTULO: Integration of an Atomic Force Microscope in a Beamline Sample Environment  Full Text
AUTORES: Rodrigues, MS; Hrouzek, M; Dhez, O; Chevrier, J; Comin, F; Garrett, R; Gentle, I; Nugent, K; Wilkins, S;
PUBLICAÇÃO: 2010, FONTE: 10th International Conference on Synchrotron Radiation Instrumentation in SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, VOLUME: 1234
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