A. Amaku
AuthID: R-00G-HTR
1
TÃTULO: A comparison between the use of EBIC and IBIC microscopy for semiconductor defect analysis Full Text
AUTORES: Breese, MBH; Amaku, A; Wilshaw, PR;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
AUTORES: Breese, MBH; Amaku, A; Wilshaw, PR;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136
